SCHEDULE: NOV 10-16, 2012
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Analyzing and Reducing Silent Data Corruptions Caused By Soft-Errors
SESSION: Doctoral Showcase - Dissertation Research Showcase
EVENT TYPE: Doctoral Showcase
TIME: 10:30AM - 10:45AM
SESSION CHAIR: Yong Chen
Presenter(s):Siva Kumar Sastry Hari
ROOM:155-F
ABSTRACT:
Hardware reliability becomes a challenge with technology scaling. Silent Data Corruptions (SDCs) from soft-errors pose a major threat in commodity systems space. Hence significantly reducing the user-visible SDC rate is crucial for low-cost in-field reliability solutions. This thesis proposes a program-centric approach to identify application locations that cause SDCs and convert them to detections using low-cost program-level error detectors.
We developed Relyzer to obtain a detailed application resiliency profile by systematically analyzing all application fault-sites without performing time-consuming fault injections on all of them. It employs novel fault pruning techniques to lower the evaluation time by 99.78% for our workloads. Using Relyzer, we obtained and analyzed the comprehensive list of SDC-causing instructions. We then developed program-level error detectors that on average provide a much lower-cost alternative to a state-of-the-art solution for all SDC rate targets. Overall, we provide practical and flexible choice points on the performance vs. reliability trade-off curves.
Chair/Presenter Details:
Yong Chen (Chair) - Texas Tech University
Siva Kumar Sastry Hari - University of Illinois at Urbana-Champaign
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